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Source Measure Unit System I-v Measure Source Meter

Thin Film Transistor Characterization System

Product Code: Thin_Film_Transistor_Characterization_System_001

This SYSTEM analyzes transfer and output characteristics of thin film transistors , TFT, OFET
The system is a complete THIN FILM TRANSISTOR CHARACTERIZATION system.

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MARKSTRONICS THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM includes

This SYSTEM analyzes transfer and output characteristics of thin film transistors , TFT, OFET
The system is a complete THIN FILM TRANSISTOR CHARACTERIZATION system.

 

The system contains the following elements:

Sourcemeter

Probe station

Voltage range: -50 V to +50 V or any range

Computer control or manuel

 

MARKSTRONICS THIN FILM TRANSISTOR CHARACTERIZATION system performs the followings

Source-drain IV characteristics under various gate voltages

Gate Voltage-Current characteristics under various drain voltages

Phototransistors Source-drain IV characteristics under various gate voltages

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