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Spin Coaters - Photolithography

Photoresponse Characteristics System

Product Code: PHOTORESPONSE_CHARACTERIZATION_SYSTEM_001

MARKSTRONICS 000 SYSTEM measures the followings:
System includes a Solar Simulator system adjusts automatically the intensity of light 0.1 W/m2 -1500 W /m2 to analyze photodiode characteristics under solar light
System measures automatically current-voltage (I-V) and current-time (I-t) characteristics of Schottky diode, pn junction , photodiode and photodetector and so on.
System measure automatically current-voltage (I-V) and current-time (I-t) characteristics of Schottky diode, pn junction , photodiode and photodetector under various wavelengths.

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Description

MARKSTRONICS 000 SYSTEM measures the followings

System includes a Solar Simulator system adjusts automatically the intensity of light 0.1 W/m2 -1500 W /m2 to analyze photodiode characteristics under solar light
System measures automatically current-voltage (I-V) and current-time (I-t) characteristics of Schottky diode, pn junction , photodiode and photodetector and so on.
System measure automatically current-voltage (I-V) and current-time (I-t) characteristics of Schottky diode, pn junction , photodiode and photodetector under various wavelengths.

System measures automatically photocurrent-wavelength (Iph-) characteristics of Schottky diode pn junction, photodiode and photodetector under various intensities
System measures automatically photoresponsivity characteristics of solar cells, photodiode and photodetector

System measures automatically current-voltage (I-V) and current-time (I-t) characteristics of Solar Cells, Schottky diode, pn junction , photodiode and photodetector under various wavelengths and intensities.

System analyzes automatically photovoltaic mechanism or photoconducting mechanism of solar cells a, photodiode and photodetectors.

System measures automatically photosensitivity, photoresponsivity, detectivity and quantum efficiency parameters of the solar cells and photodetectors.

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