Showing 37–48 of 59 results

OFET Characterization System

Product Code: OFET_Characterization_System_001 MARKSTRONICS THIN FILM TRANSISTOR CHARACTERIZATION SYSTEM analyzes transfer and output characteristics of thin film transistors , TFT, OFET

Open System Nitrogen Cryostat

Product Code: CRYOSTAT_001 Temperature range: RT to 80K Cryostat for I-V and C-V measurements Cryostat for electrical measurements

Optical Constants Characteriation System

Product Code: Optical_Constants_Characteriation_System_001 Optical constants of thin film and powder materials MARKSTRONICS FY-OPC analyze the followings FY-OPC automatically determine optical constants of materials using transmittance and reflectance spectra Software determine analyze all optical constants

PHOTOCATALYSIS SOLAR SIMULATOR

Photocatalysis solar simulator system irradiates the solar light for various times.  Irradiation direction can be adjusted for any direction such as horizontal, vertical or any direction.

Photoresponse Characteristics System

Product Code: PHOTORESPONSE_CHARACTERIZATION_SYSTEM_001 MARKSTRONICS 000 SYSTEM measures the followings: System includes a Solar Simulator system adjusts automatically the intensity of light 0.1 W/m2 -1500 W /m2 to analyze photodiode characteristics under solar light System measures automatically current-voltage (I-V) and current-time (I-t) characteristics of Schottky diode, pn junction , photodiode and photodetector and so on. System measure automatically current-voltage (I-V) and current-time (I-t) characteristics of Schottky diode, pn junction , photodiode and photodetector under various wavelengths.

Press

Product Code: PRESS_001 DESK TOP PRESS Pressure: 20 ton or 60 MPa or 600 Bar To prepare FTIR pellet Powder pellet for electrical measurements Powder pellet for optical measurement

Press Die

Product Code: PRESS_DIE_001 MARKSTRONICS PRESS DIE MARKSTRONICS PRESS DIE is used for various applications; Pressure: 0-10 ton, 0-100 Bar Diameter: 13 mm

Scs Semiconductor Characterization System

Product Code: CHARACTERIZATION_SYSTEM_001 1. I-V and C-V, G-V Characterization System This system analyze all electrical characteristics of photodiode, Schottky diode, heterojunction diode and sensors under dark and illumination conditions

Solar Simulator AAA Class

SOLAR IV CHARACTERIZATION SYSTEM includes SOLAR SIMULATOR I-V CHARACTERIZATION SYSTEM, SOURCEMETER SAMPLE HOLDER CONNECTIONS   SOFTWAREs Solar IV characterization Software